WebSemi, Innovate Yield Management & Test Data Analysis Solution

Innovate Yield Management & Test Data Analysis Solution

WebSemi Yield Management System provides a flexible all-in-one yield management and testing data analysis solution for fabless semiconductor manufacturers, IDMs (Integrated Device Manufacturers), as well as outsourced assembly and test companies.

Capable to manage all stages testing data of semiconductor manufacturing, from WAT/PCM, CP to FT tests, with strong traceability and cross stages data analysis ability, users could freely perform commonality analysis, correlation analysis and and regression analysis so on.

Instant data analysis capabilities, allowing statistical analysis of your data at any time, performing statistical summary, data visualization and analysis of variance of semiconductor testing data.

Enterprise-oriented and flexible system architecture, can be deployed easily based on business size.

Yield Analysis Faster, Simpler & Smarter.

Powerful data engine, well-designed data structures and standardized process flow, ensuring to provide the data quickly for analysis.

The specially designed data analysis methodology, operation flow, and data visualization for the semiconductor field provides the standard data analysis, visualization, commonality and correlation analysis etc.

System integrated with powerful statistical computation engine, could provide statistical computing and statistical analysis instantly.

Open data access APIs to advanced users, for data processing and automation applications development.

Enterprise-oriented architecture

Flexible software architecture that can be deployed according to the scale of business. Deployment scenarios can provide from simple stand-alone solutions to high performance cluster solutions.

Seamless Data Integration

Systems can be seamlessly integrated into the customer's data system and its supply chain systems, capable to automatically find and import new data.

Data Files Format Compliance

Natively supporting STDF format data files, we provide data file format conversion services, fully support a variety of non-standard data file importing.

Open data access APIs to users, which allows users to develop data processing and auto reporting applications.

Data Visualization

Perfect wafer and dut maps for software bins, hardware bins and parametric values, as well as the according composite wafer and dut maps, etc.

Statistical Data Analysis

Easy for yield summary and analysis, identifying the major failures, variety of data analysis plots, including trend charts, bar chart, pareto chart, histograms, scatter chart, boxplot and probability plot etc., capable for regression analysis and variance analysis.

Statistical Yield Control

Based on statistical analysis methodology, WebSemi provides SYL/SBL method, to perform real-time monitor of testing yield and software & hardware binning. Abnormal testing results will be sent timely to users through mail system.

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